Dual Beam Microscope – FEI Altura 835

The FEI Altura 835 from TSS Microscopy is equipped with SFEG UHR SEM, Magnum Column, Bridge tool for wafers to small parts, 205 x 205 mm XY, turbo vacuum, five-axis stage, and two GIS included along with two optional GIS. Installation and custom configuration is available.

Standard Services

Standard Services

Optional Upgrades and Services

Optional Upgrades and Services

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