Dual Beam Microscope – FEI Altura 855

The FEI Altura 855 manufactured by TSS Microscopy is equipped with Sidewinder Column, Bridge tool for wafers to small parts, SFEG UHR SEM, five-axis stage, turbo vacuum, 205 x 205 mm XY, two GIS included, with two GIS options available. Installation and custom configuration is available.

Standard Services

Standard Services

Optional Upgrades and Services

Optional Upgrades and Services

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