Thermo Scientific Prisma E SEM for Materials Science

The Prisma E scanning electron microscope (SEM) is the most complete SEM for multi-user laboratories. Combining an array of imaging and analytical modalities with advanced automation capabilities, it guarantees all-round performance while being easy to use. The successor to the respected Quanta SEM, the Prisma E is suitable for quality control, industrial R&D and failure analysis, or indeed any application that requires high resolution, an easy-to-use interface and sample flexibility.

Imaging Capabilities

In a multi-user laboratory, time management is vital. As such, a microscope used in these environments must be able to produce high quality images, including all relevant data, within a short space of time. Prisma E easily fulfills this need thanks to its robust imaging system, which is based on a tetrode gun assembly.

This system delivers first-class results with a wide range of vacuum conditions and beam energies, with compositional and topography images providing the required sample information simultaneously. This information is readily available for additional analysis and interpretation.

Prisma delivers equal performance on both insulating or sensitive samples, and on traditional samples. Its ability to work at low beam energy, even in a low vacuum, allows for extraction of true surface information.

Simultaneous detection of compositional and topographic information allows Prisma to provide complete sample information via a single scan of the electron beam. Both sets of data (compositional and topographic) are then combined in one image.

Simultaneous detection of topographic (left) and compositional (middle) information provides all sample information in a single scan of the electron beam. The topographic and compositional data are combined in one image (right) that shows all information. Sample: polymer-metal composite

Simultaneous detection of topographic (left) and compositional (middle) information provides all sample information in a single scan of the electron beam. The topographic and compositional data are combined in one image (right) that shows all information. Sample: polymer-metal composite

Simultaneous detection of topographic (left) and compositional (middle) information provides all sample information in a single scan of the electron beam. The topographic and compositional data are combined in one image (right) that shows all information. Sample: polymer-metal composite

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