Analyzing Physical Properties with the LensAFM

The Nanosurf LensAFM is a robust add-on to optical microscopes or 3D profilometers. It is an atomic force microscope that can be used instead of a normal objective lens on virtually any optical microscope or profilometer. It significantly extends the resolution and measuring features of these instruments. The LensAFM not only offers 3D surface topography information but can be used to examine different physical properties of a measurement sample as well.

Main Features and Benefits of the LensAFM

  • Mountable on almost any 3D optical profilometer or optical microscope
  • Fitted with a quality objective lens for a clear view of the sample and the AFM cantilever
  • Sample positioning is made simple with the optical microscope’s view finder and position manipulators
  • Integrated motor for automated cantilever method. The user just needs to place the sample into optical focus and the LensAFM will do the rest
  • Large AFM Z-range permits measurement of high structures
  • All basic AFM modes available via the modular easyScan 2 controller
  • Highly intuitive. Nanosurf’s ease of use ensures a very short learning curve

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