The surface inspection probes from ETher NDE offer outstanding low-frequency performance with a wide frequency range, delivering focused penetration through numerous layers of material.
Surface Inspection Probe: Sub-Surface Probe
Some of the Key Features of ETher NDE’s Sub-Surface ID Inspection Probe include:
- Integrated four-way Lemo Connector
- Right-angled probes are intrinsically balanced
- Built-in balance coils
Surface Inspection Probe: Flat-Surface Probe
Some of the Key Features for ETher NDE’s Flat-Surface ID Inspection Probe include:
- Low profile
- Integral 1.5 m cable
- Built-in load
Benefits
- Broad frequency ranges
- Exceptional low-frequency performance
Applications
Sub-Surface ID Probes: Reflection sub-surface probes - For general purpose inspection of sub-surface corrosion and defects. This probe has superior depth penetration making it suitable for multi-layer inspections.
Flat-Surface ID Probes: Absolute metal sorting and general surface probes – low profile, therefore, perfect for areas that are hard to inspect.