Bruker’s Hysitron® TS 77 Select™ automated benchtop nanomechanical and nanotribological test system offers the maximum level of functionality, performance, and accessibility of any tool in its category.
Developed based on Bruker’s famous TriboScope® capacitive transducer technology, the Hysitron® TS 77 Select™ delivers dependable tribological and mechanical characterization over nanometer-to-micrometer length scales.
The TS Select™ supports the most typical testing approaches, making it an economical entry into quantitative nanoindentation, nanoscratch, dynamic nanoindentation, nanowear, and high-resolution mechanical property mapping.
Hysitron® TS Select™ Testing Modes
High-Precision Mechanical Characterization
Nanoindentation is a standard method for the characterization of stress relaxation, elastic modulus, creep, fracture toughness, and hardness of localized microstructures, small surface features, interfaces, and thin films.
The TS Select™ leverages Bruker’s well-established Hysitron® TriboScope capacitive transducer technology to provide dependable and quantitative mechanical property measurements across the nanometer-to-micrometer length scales.
In-Situ SPM Imaging
Enabling Superior Nanomechanics
Bruker’s in-situ scanning probe microscopy (SPM) employs the same probe for sample surface rastering to perform topography imaging as it performs the nanomechanical test. The potential to observe the sample surface on the same length scale as the testing, offers outstanding nanomechanical characterization results and data dependability. In-situ SPM imaging ensures nanometer-precision test placement accuracy, thereby guaranteeing that the test is carried out at the site on the material that is precisely desired.
Mechanical Property Mapping
High-Speed Mapping and Fast Data Acquisition
The TS Select™ offers high-speed testing capabilities, up to 180 times faster than conventional nanoindentation measurements. The system can perform two nanoindentation tests per second, thus achieving high-resolution mechanical property maps of inhomogeneous materials in a few minutes. Furthermore, high-speed testing abilities allow statistically significant datasets to be rapidly obtained for greater confidence in results.
Quantitative Nanoscale Wear Resistance
The use of in-situ SPM imaging features on the TS Select™ enables quantitative wear volumes and wear removal rates to be measured as a function of sliding speed, applied contact force, and number of passes. The scale of testing enables the tribological performance of separate microstructures, thin films, and interfaces to be measured freely.
TS Select™ Control Software
Streamlined System Operation and Data Analysis
Bruker’s TS Select™ control and analysis software package was particularly created to streamline the measurement process—from test framework and loading samples to the execution of measurement and data analysis. The TS Select™ control software integrates automated sample testing and instrument calibration procedures for standard, high throughput, and error-free characterization.
Hysitron® TS Select™ Options
Depth Profiling, Viscoelastic Properties
Dynamic nanoindentation involves superimposing a tiny oscillatory force over a quasi-static force component to achieve uninterrupted measurement of modulus and hardness as a function of depth into the surface of a material. The dynamic nanoindentation option comprises a capacitive transducer enhanced for dynamic measurements and a controller-incorporated lock-in amplifier to provide excellent results as a function of testing depth, time, and frequency.
Friction, Mar Resistance, and Thin-Film Adhesion
Nanoscratch involves using an electrostatically actuated 2D transducer to exert a standard force in a regulated manner while concurrently measuring the force needed to shift the tip laterally over the sample surface. The nanoscratch option does not depend on motorized staging for lateral movement, thus offering the most dependable and sensitive thin-film adhesion and nanoscale friction measurements in the market.
Only TS 77 Select™
- Features high-speed indentation for quick mechanical property mapping and statistically important datasets
- Provides a vital toolkit of essential testing methods, including dynamic nanoindentation, nanoindentation, nanowear, nanoscratch, and in-situ SPM imaging
- Offers easy test framework with pre-written test functions in compliance with the ASTM E2546 and ISO 14577
- Offers high sensitivity together with low thermal drift through electrostatic actuation with capacitive displacement sensing transducer technology
- Allows technician-level operators to carry out measurements in a reliable way using its intuitive and user-friendly control software
- Carries out automated system calibrations and multiple sample testing procedures for faster results
Nanomechanical and Tribological Testing with the Hysitron TS Select
Hysitron TS Select Configuration
Mechanical Property Mapping
TS Select Control Software
Bruker Nanomechanical Test Instruments