The Lightning In Situ TEM Biasing & Heating Series from DENSsolutions offers customers the power to acquire real-time data about specimen dynamics activated by electric fields and/or temperature. Users can analyze the next-generation of nano-electronic materials and devices using the Lightning Series.
Lightning Application Fields
- Solar cells
Sample Preparation with Conventional Techniques
The sample preparation methods used for preparing conventional TEM samples such as nanowires, lamellas, and particles are ideal for the Nano-Chip. FIB lamellas are the most frequently used samples for biasing experiments. DENSsolutions has collaborated with a few academic partners to create a distinctive FIB workflow using a tailored FIB stub exclusively designed for the Nano-Chip.
This process considerably decreases the total workflow time and delivers a better success rate. Additional techniques like micro-manipulators are ideal for sample preparation onto the Nano-Chip.
- FEI/Thermo Fisher Scientific
Collect Sample Dynamics with In Situ TEM Biasing and Heating
Lightning Sample Holder Tip