Using the Fusion TEM Heating and Electrical Characterization System to Transform your TEM

Using the flexibility of MEMS-based sample supports, Fusion Select converts users’ TEM into an in-situ laboratory. Sample supports like these provide precise and accurate experimental conditions.

The Fusion Select can source and measure electrical signals at the picoamp level, and also at rapid temperature variations up to 1200 °C. Thus, it provides unparalleled capability and versatility to speed up results.

Fusion Select TEM holder (JEOL)

Fully Upgradeable

The Fusion Select is a completely upgradeable solution, which means users can select the configuration that matches their current requirements and can still upgrade anytime to features they may need later. Users need not purchase more than what they need, or hold on to a holder that has limited capabilities.

  • Users can perform most upgrades on-site in just a few minutes
  • Double-tilt, electrothermal, and electrical capabilities can be incorporated into the Fusion Select base system, anytime

heating and electrical characterization system

Tilt with Confidence

An exclusive beta tilt design of the Fusion Select makes sure that electrical current and temperature continue to be stable when samples are tilted. The contacts and E-chip tilt together, allowing users to locate their sample’s zone axis precisely and rapidly, regardless of extreme temperatures.

  • Constant temperature can be maintained while tilting for the highest stability
  • The system now comes with ±20° of beta tilt and up to ±34° alpha tilt (dependent on pole piece)


High-resolution TEM image of Al inclusions (courtesy Larry Allard, ORNL). Side view of the Fusion Select holder, showing the fixed probe beta tilt design.

Unobstructed EDS Maps

The low-profile tip design of the Fusion Select ensures that users get unprecedented access to high-count X-rays to their multidetector EDS arrays, even at a tilt of 0°.

  • EDS maps up to 750 °C can be obtained (dependent on EDS detector)
  • EDS spectra and maps can be acquired more quickly with low background signal from the holder


AuAg nanoparticles, Au (green), Ag (red) at room temperature, and heated to 400 °C. Lewis, et al., Nanoscale, 6, 2014.

Electrical Performance Without Compromise, Including FIB Optimized Workflow

With a recently developed electrothermal E-chip and more electrical contacts, the Fusion Select now provides users with the flexibility to carry out a wide range of electrothermal experiments.

  • Robust software enables users to carry out sophisticated electrical measurements in a user-friendly interface
  • Four-point probe electrical characterization can be performed with precise heating
  • Clarity Echo synchronization tool saves time for users by syncing Clarity data with Gatan’s DigitalMicrograph® video and images
  • FIB sample workflow with sample prep tools and special FIB optimized E-chips

Clarity Echo data synchronization and Data View

Major Applications

  • Reaction kinetics
  • Material phase changes
  • Corrosion
  • Semiconductor

Using the Fusion TEM Heating and Electrical Characterization System to Transform your TEM

Fusion Select TEM holder (JEOL)
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High resolution TEM image of Al inclusions (courtesy Larry Allard, ORNL). Side view of the Fusion Select holder, showing the fixed probe beta tilt design.
AuAg nanoparticles, Au (green), Ag (red) at room temperature, and heated to 400 °C. Lewis, et al., Nanoscale, 6, 2014
Clarity Echo data synchronization and Data View

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