Holey Film TEM Grids for Premier Sample Support

Protochips offers premier sample supports with holey thin film coatings that are ideally suited for Cryo-EM. The transmission electron microscopy grids from Protochips do not contain residues or plastics, and can be readily used without any further cleaning or handling measures.

Protochips provides a range of mesh materials, mesh sizes, hole patterns, thin or thick film options, and film materials; there is always a product optimized for your requirements.

The following parameters define the Holey Film TEM Grids:

  • Hole spacing: sizes range from 1 to 4 µm
  • Hole diameter: size varies from 1.2 to 8 µm
  • Grid material: gold and copper
  • Film material: gold alloy and carbon
  • Film thickness: 20 nm and 40 nm
  • Grid mesh size: 200, 300, and 400

Holey Film TEM Grids for Premier Sample Support

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C-Flat TEM Grid

The ultra-flat holey carbon grid is ideally suited for cryo-EM. With 54 types, there is always a C-flat™ product made to suit your requirements.

C-Flat TEM Grid

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Au-Flat TEM Grid

Users can enhance their image resolution and quality with the gold alloy film of Au-Flat, which decreases the movement of particles at the time of imaging.

Au-Flat TEM Grid

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CD-Flat TEM Grid

The premier holey carbon sample support for automated STEM and TEM imaging and metrology.

CD-Flat TEM Grid

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Au-FLAT

Au-FLAT is a special gold foil sample support with excellent stability for Cryo-EM.

  • Long-lasting
  • Biocompatible
  • Improved datasets
  • Quick delivery
  • Avoid errors

Au-FLAT

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Applications

Au-Flat and C-Flat offer the perfect specimen support to users to obtain high-resolution data, rendering it the ideal choice for cryo-tomography and single-particle analysis.

CD-Flat is the prime transmission electron microscopy sample support developed for automatic STEM and TEM imaging and metrology.

Cryo-Electron Microscopy

Scientists have reported that the ultra-flat surface of the C-flat results in thin ice and even distribution of particles, allowing excellent data collection compared to other support films.

Cryo-Electron Microscopy

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CD-TEM

TEM-based metrology is required to quantify the crucial dimensions of semiconductor thin films, including transistor gate structures. C-Flat offers a standard array of analysis sites enclosed with a thin, amorphous sample support—features that are needed for the automated characterization of CD-TEM.

CD-TEM

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