The back-reflection Laue system from Photonic Science enables real-time crystal orientation down to an accuracy of 0.1°.
Thanks to PSEL software, misorientation measurement can be performed down to 0.05°.
Two-dimensional orientation mapping of polycrystalline silicon wafers can also be performed.
The system can be used to perform high-throughput sample screening and heavy-duty sample orientation up to 20 kg in production settings.
The Photonic Science back-reflection Laue system enables real-time crystal orientation down to an accuracy of 0.1 degrees by delivering an intense X-ray beam of below 0.3 mm on the sample. The electro-optical properties of single crystals strongly depend on crystallographic orientations.
The LAUE tool gathers a high-resolution X-ray diffraction pattern from the single crystal. From this pattern, the optimal crystallographic plane cut can be chosen with excellent precision.
|<200 μm beam size
||For small crystals
||Allows scanning along the growth axis
||Direct compatibility with synchrotron / Neutron facilities set up
||Direct compatibility with cutting tools
|<200 μm beam size
||Works with small grain polycrystalline structures
|Large scanning linear stages
||Allows automatic wafer or multiple sample mapping
|Motorized Z stage
||Allows compatibility with large rod/samples
||Allows seed orientation down to +/- 0.02-degree accuracy
- X-ray generator with maximum brilliance
- Laue X-ray detector
- Manual or motorized goniometer as well as high precision stages
- Laue alignment software
- Joystick or laser distance sensor
- Video camera for viewing or positioning sample
Laue Image Alignment Software
- Diffraction spots are automatically detected and the spot position is estimated against reference crystal
- Stores angular measurements in CSV format for quality assurance traceability later
- Automatically evaluates misorientation against goniometer and crystallographic axis (no manual fit of deformed patterns)
- Python-based software enables remote access control from present software or system by making use of socket commands
- Top to bottom end user menu enabling stepwise validation of the orientation procedure for non-initiated crystallography users