Xeuss 3.0 is the latest X-ray scattering laboratory beamline from Xenocs.
Specifically designed for characterizing nanostructured materials, the Xeuss 3.0 advanced beamline employs small-angle X-ray scattering and wide-angle X-ray scattering (SAXS/WAXS) in both grazing incidence (GI) and sample transmission to acquire structural data at the atomic scale and nanoscale.
Thanks to optional ultra-small angle X-ray scattering (USAXS), the characterization scale can be extended to a few micron-sized structures.
(GI-)SAXS/WAXS/USAXS Beamline for the Laboratory
The Xeuss 3.0 beamline benefits from two decades of innovation and over a decade of customer experience on Xeuss SAXS systems and on in-vacuum motorized detector travel technology (Q-Xoom). These aspects make it the next-generation beamline for laboratories.
Maximum Flexibility
Through fully motorized changes of instrument configurations, users can extend the resolution of the characterized structures from the atomic scale up to a few microns. This provides structural tools to a large number of users with high throughput and complete remote operation.
Unique Measuring Performance
The Xeuss 3.0 provides exceptional data quality in terms of high signal to noise, detectable Q-range, and absolute intensity precision. Users can achieve better measurement quality through premium detectors, optics, sources, and long-travel Q-Xoom moving detectors.
Plenty of Space for Sample Environments
The Xeuss 3.0 allows unique freedom and space at the sample area, without requiring users to move their samples to change the resolution of the instrument. This feature provides flexibility for upcoming sample environment requirements.
Multi-Application Instrument
As a multi-application instrument, the Xeuss 3.0 could be used for defining a wide range of materials, like semi-crystalline or block polymers, alloys, proteins in solutions, nanoparticles, and colloids.
The Xeuss 3.0 is supplied with a robust software suite that includes Xenocs XSACT data analysis software, offering comprehensive algorithms along with high user experience.
Examples of applications and measuring parameters are given below:
- Size distribution of particles in powders or dispersions between few nanometers and few hundred nanometers
- Lamellar structure and crystalline fraction for semi-crystalline polymers
- Structural orientation in stretched polymers
- Phase analysis for liquid crystals or mesoporous systems
- Shape and size of nano-objects
- Molecular weight of polymers or proteins diluted in a solution
- Dynamic analysis of nanostructures based on shear, tensile, humidity, and temperature
Key Features and Benefits
The Xeuss 3.0 provides high flexibility of measurement configurations with a high degree of automation in data acquisition to offer the most optimal data quality on all types of samples. The main features include:
- Motorized Bonse-Hart USAXS along with an additional movable WAXS detector
- Motorized multi-energy source depending on sample absorption
- Long-travel Q-Xoom in-vacuum moving detector
- Very large surface of detection for optimized resolution or anisotropic samples
- Extremely large vacuum chamber with large free space at the sample area
- Beamstop-free data acquisition for high dynamic range and highly precise data
- Clean beam technology provides low background and high intensity
Field of Research
The Xeuss 3.0 is a perfect shared characterization facility instrument designed to reliably fulfill the requirements of material scientists and X-ray scattering experts working in numerous field of research:
- Polymer research
- Structural biology
- Colloids and nanoparticles
- Food science
- Oil and gas
- Inorganic materials
- Renewable energy
- Cosmetics and consumer care
For more information on SAXS applications, customers can visit Xenocs’ website.