The ZEISS Sigma range of field emission scanning electron microscopes from Carl Zeiss has been specifically developed to provide users entry to the world of high-end imaging: It offers high-quality imaging and advanced analytical microscopy.
Collectively, several advantages have been gained by the combination of field emission SEM technology with advanced analytics. Researchers profit from Gemini 1 electron optics. Users can image nanostructures, surfaces and particles by selecting from a range of detectors.
Time is saved by a semi-automated four-step workflow. Therefore, users’ analysis and imaging routines can be carried performed with improved productivity.
- ZEISS Sigma 300 excels when it comes to price and performance
- Researchers can utilize ZEISS Sigma 500 to perform elemental analysis rapidly and conveniently with best-in-class EDS geometry