Posted in | Materials Testing and Characterisation

XLNCE SMX-BEN XRF Analyzer from EDAX

This video describes the functioning of the EDAX XLNCE SMX-BEN, an Energy Dispersive X-ray Fluorescence (EDXRF) analyzer designed to provide quick, non-destructive coating thickness as well as composition analysis on any material. This benchtop device is suitable for process development, failure analysis and R&D, accelerating material selection as well as recipe formulation during early production phase.

Specialized application areas for the XLNCE SMX-BEN include protective metallic coatings, wafer level metallization, micro-electronics, corrosion/wear and thermal barrier analysis, and photovoltaic manufacturing.

Run Time – 2:01min

XLNCE SMX BEN Benchtop ED-XRF Analyzer from EDAX

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