The New XE-100 Series Atomic Force Microscopes from Park Systems

We are introduced to Park Systems new XE-100 series general purpose AFMs. Dr. Sang-il Park explains how the use of a x-y scanner and decoupled z scanner produces very flat scans and how their system can operate in a true non-contact mode to produce accurate, high resolution images, with excellent reproducibility. As well as topographical information, the XE-100 series AFMs can also measure electrical, magnetic, mechanical and optical properties of materials.

They also have a variant that can analyze biological samples. Furthermore, using Scanning Ion Conductance Microscopy (SICM) technology, which is unique to Park Systems, their AFMs open up new possibilities for nanobiologists..

Run Time - 5:28min

Other Videos by this Supplier

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Submit

Materials Videos by Subject Matter