The New XE-100 Series Atomic Force Microscopes from Park Systems
We are introduced to Park Systems new XE-100 series general purpose AFMs. Dr. Sang-il Park explains how the use of a x-y scanner and decoupled z scanner produces very flat scans and how their system can operate in a true non-contact mode to produce accurate, high resolution images, with excellent reproducibility. As well as topographical information, the XE-100 series AFMs can also measure electrical, magnetic, mechanical and optical properties of materials.
They also have a variant that can analyze biological samples. Furthermore, using Scanning Ion Conductance Microscopy (SICM) technology, which is unique to Park Systems, their AFMs open up new possibilities for nanobiologists..
Run Time - 5:28min