X-MAX Silicon Drift Detectors for SEMs and TEM from Oxford Instruments

Del Redfern from Oxford Instruments shows us their X-MAX silicon drift detector, the world's largest area silicon drift detector (SDD). The X-MAX is suited to almost all SEMs and most TEMs and produces the best performance for a SDD with resolution down to 124eV for Manganese and less than 50eV for Carbon. The X-MAX also features high speed analysis, leading to high throughput and excellent data integrity.

It can collect counts at very low beam currents, which is excellent for nanoanalysis. The X-MAX comes in 3 models, the 20, 50 and 80mm variants which are suited to various applications and budgets. They can be integrated with the INCA software package which provides quantitative analysis with excellent data integrity as they are calibrated for this particular device.

The X-MAX silicon drift detectors are suited to applications in SEMs and TEMs such as:

  • Spot analysis
  • Area analysis
  • X-ray mapping

Run time - 5:05min

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