Park Systems NX10 Atomic Force Microscope (AFM)
Park Systems launched the NX10 atomic force microscope (AFM) recently and showed it for the first time at the MRS Fall Meeting in Boston. Mark Cyffka takes us for a tour of their all new AFM which is claimed to be the world's most accurate AFM.
The main features are:
- The high speed Z-scanner which improves non-contact performance
- It's ability to generate topographic signals with very low noise Z-position sensor, which removes piezo artifacts
- The completely redesigned electronics and control system
The NX10 also features a new user interface with improved user friendliness and ease of use and machined metal components that are thermally matched to reduce drift.
Run time - 5:42min