PANalytical: Advanced XRF Standardless Analysis by Omnian on Epsilon 3
This video shows the advanced XRF standardless analysis performed with the PANalytical’s Omnian on Epsilon 3 XL - EDXRF benchtop spectrometer.
The fast and reliable Omnian software, in conjunction with the Epsilon 3 module, allows the characterization and analysis of any unknown sample. Moreover, by using the Adaptive Sample Characterization (ASC), the software can be fine-tuned for increased accuracy.
Run Time – 2:55min