EDAX Pairs Element Silicon Drift Detector with New APEX Software Package for Tabletop Scanning Electron Microscopes

EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced new APEX Analysis software for its Element Silicon Drift Detector (SDD) for tabletop scanning electron microscopes (SEMs), a product line focused on serving the needs of the industrial market.

The APEX software package for Element was developed with a primary focus on industrial needs and ensures high-end results, combined with ease of use. Built on fundamentally new quantification algorithms, APEX accelerates and simplifies compositional analysis and delivers high-quality data processing with accurate and reliable results.

With its touchscreen capability, the APEX interface is very user-friendly and can be customized for a specific workflow, offering a wide choice of layouts, colors and data report formats. It has a modular architecture and can be interfaced with external application packages.

The Element SDD delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and easy operation. It offers excellent resolution and market-leading throughput. It is designed with a silicon nitride (Si3N4 ) window to optimize low-energy X-ray transmission for light element analysis. The Element SDD’s advanced design allows for a small footprint for the growing tabletop SEM market.

The APEX Analysis software package is a perfect extension of our customized product line for industrial applications. Element with APEX Analysis software, provides an easy-to-use microscopy tool, that offers fast and efficient results for industrial analysis needs.

Oleg Lourie, Senior Product Manager for EDS

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