With the launch of two new detectors for its Octane Elite Silicon Drift Detector (SDD) Series, EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, continues to take detector technology to the next level and offer analytical tools that deliver industry-leading results.
The Elite Plus and Elite Super detectors both include new, cutting-edge electronics and advanced sensor designs with multi-channel architecture that ensures the fastest acquisition rates, high collection efficiency and unmatched throughput levels and performance. They include the next generation of CMOS preamplifiers, based on widely praised CUBE technology, which offers low noise at high count rates. The SDD sensors are vacuum encapsulated and protected by a silicon nitride (Si3N4) window allowing for higher collection efficiency, increased light element sensitivity and improved resolution stability. The window is chemically inert and impermeable to moisture, which protects the sensor from contamination and condensation.
The Si3N4 window includes a honeycomb-shaped silicon support grid that allows it to be more transparent to X-rays. It can withstand daily plasma cleaning, ensuring high transmission properties for long-term applications, such as focused ion beam (FIB) or environmental Scanning Electron Microscopes (SEMs).
The new Octane Elite SDDs have a robust, ergonomic, enclosed modular design with a smaller environmental footprint without pinch points and include integrated automatic slides. They are paired with dedicated TEAM™ Analysis Software, including quantitative analysis with Fast Phase Mapping and dynamic Spectrum Library Match capabilities.
The new Octane Elite SDD Series upholds the Octane legacy in high spectral resolution consistency at all count rates. It offers an unprecedented level of EDS performance that pushes the boundaries of microanalysis.
Oleg Lourie, Senior EDS Product Manager at EDAX.