Introducing the leading solution for correlative AFM-SEM-EDX analysis.
The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEMTM enables you to easily combine three of the most powerful analysis techniques available - AFM, SEM, and EDX - to greatly extend your correlative microscopy and analysis possibilities.
This recorded webinar by Nanosurf and GETec explores the recent advances in correlative AFM-SEM-EDX analysis and shows how to combine these techniques in an interactive experiment.
Topics covered include:
||Introduction and overview of the AFSEMTM system
||Compatibility to existing SEMs and additional add-ons
(e.g. tensile stages or nanoindenters)
||Recent application advances
(e.g. in-situ roughness and conductivity analysis,
correlative SEM/EDX/AFM, 3D tomography)
Experts answer application and instrumentation questions by viewers towards the end of the video.
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