Posted in | Materials Analysis

Bruker Introduces Contour LS-K 3D Optical Profiler

LightSpeed Focus Variation Technology Provides Fast, Extremely Accurate Metrology

Contour LS-K 3D Optical Profiler

At the 32nd Control 2018 international trade fair for quality assurance, Bruker today announced the release of its new Contour LS-K  3D optical profiler with LightSpeed™ focus variation technology. This technique uses optimized focusing with advanced algorithms to construct 3D surface maps at speeds impossible to achieve with other methods. The Contour LS-K uniquely enables both easy-to-acquire high-resolution images and reliable metrology data. The system rapidly captures surface data with market-leading field of view at vertical scanning speeds up to 5 millimeters per second. Unlike comparable solutions, Contour LS-K also provides quantitative metrology with access to raw measurement data, and a proven comprehensive software package for in-depth analysis.

The LightSpeed focus variation method is ideal for surfaces with significant roughness, large step heights, or steep angles and is a perfect complement to the existing Bruker ContourGT white light interferometry product line, which is optimized toward smoother surfaces and nanometer resolution. Engineers and metrologists in automotive, precision machining, manufacturing, electronics, and medical device markets will greatly benefit from the Contour LS-K for many applications, including mechanical testing, QA/QC inspection, process control, and R&D.

“We have been familiar with Bruker and their excellent reputation in white light interferometry for many years now,” said Professor Maxence Bigerelle, Director of ENSIAME, University of Valenciennes and Hainaut-Cambresis. “The fact that they are releasing a new platform based on a completely different optical technique is a very positive step for the industry. Bruker’s commitment to innovation will certainly increase the pace of new technology development in this area, while their dedication to pure optical metrology will give us many exciting products for both research and industrial applications.”

At Bruker we have a solid foundation of industrial metrology excellence; it is a core part of our culture. With LightSpeed focus variation, we expand the reach of that gold standard approach to provide an underserved community with all the benefits of speed and convenience, but without compromising the integrity of the metrology.

James Earle, Vice President and General Manager of Bruker’s Tribology, Stylus and Optical Metrology Business

About the Contour LS-K 3D Optical Profiler

The Contour LS-K optical profiler uses Bruker’s new LightSpeed focus variation technology to accurately gather surface data without contacting the sample or part. It has been designed from the ground up to capitalize on rapid data acquisition, and data-rich images are displayed in high-resolution and in real color within seconds. The system features new proprietary software algorithms for data processing, analysis and visualization that are built on the foundation of decades of Vision64® software innovation. Every Contour LS-K is also equipped with automated X-Y stages, a motorized five-position objective turret, and dual lighting (coaxial and ring light) as standard equipment to ensure gold-standard metrology.

Stuart Milne

Written by

Stuart Milne

Stuart graduated from the University of Wales, Institute Cardiff with a first-class honours degree in Industrial Product Design. After working on a start-up company involved in LED Lighting solutions, Stuart decided to take an opportunity with AZoNetwork. Over the past five years at AZoNetwork, Stuart has been involved in developing an industry leading range of products, enhancing client experience and improving internal systems designed to deliver significant value for clients hard earned marketing dollars. In his spare time Stuart likes to continue his love for art and design by creating art work and continuing his love for sketching. In the future Stuart, would like to continue his love for travel and explore new and exciting places.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Bruker Nano Surfaces. (2018, April 25). Bruker Introduces Contour LS-K 3D Optical Profiler. AZoM. Retrieved on November 21, 2019 from https://www.azom.com/news.aspx?newsID=49054.

  • MLA

    Bruker Nano Surfaces. "Bruker Introduces Contour LS-K 3D Optical Profiler". AZoM. 21 November 2019. <https://www.azom.com/news.aspx?newsID=49054>.

  • Chicago

    Bruker Nano Surfaces. "Bruker Introduces Contour LS-K 3D Optical Profiler". AZoM. https://www.azom.com/news.aspx?newsID=49054. (accessed November 21, 2019).

  • Harvard

    Bruker Nano Surfaces. 2018. Bruker Introduces Contour LS-K 3D Optical Profiler. AZoM, viewed 21 November 2019, https://www.azom.com/news.aspx?newsID=49054.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit