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Results 41 - 50 of 19669 for A-Si
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    Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process...
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    HORIBA Scientific, part of HORIBA Instruments, Inc., headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific...
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    Levicron is a Germany based developer and manufacturer of high-speed tooling and work-holding motor spindles using patented non-contact bearing technologies like aerostatic or hydrostatic bearing...
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    Precitech began operations in 1992, but continues the rich history of ultra-precision machine tool building dating back to 1962, when Pneumo Precision was founded. In October of 1997, the Pneumo...
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    Ether NDE are a dedicated manufacturer of Eddy Current NDT equipment and accessories including a vast range of EC Weld Probes, ET Weld Probes and ECT Weld Probes and are the 'go to' company...
  • Article - 11 Jan 2006
    Research on processing â­“i3N4 ceramics and their thermal conductivity are reviewed. Thermal conductivities are greatly affected by processing parameters such as purity of raw powders, type and amount...
  • Article - 22 Nov 2010
    In this study, the microstructural design, synthesis and evaluation for the quaternary Cr-Al-Si-N coatings were investigated. Also, the overall comparisons among CrN, Cr-Al-N, Cr-Si-N, and Cr-Al-Si-N...
  • Article - 7 Oct 2005
    While magnesium alloys have excellent strength to weight characteristics, they have poor wear resistance when emplyed in friction applications. Reinforcing with Mg2Si dispersoids was found to be...
  • Article - 19 May 2006
    In this paper researchers analyzed the structural evolution of a Si(001) surface and the change in surface composition during a reaction of MMGe on the surface. The researchers found that a c(4x4)...
  • Article - 12 Nov 2013
    This article discusses using handheld raman spectrometers to define the difference between a-Si and c-Si in tertiary mixtures of methanol.