Article - 7 Nov 2005
Three main evaporation parameterss were controlled to produce Si-Al-O-N coatings: oxygen flux, nitrogen flux and substrate bias potential. These alterations allowed a diverse range of coatings with...
Article - 5 Oct 2007
Find out about International Syalons, the UK's leading manufacturer of sialon and silicon nitride based ceramics.
Article - 29 May 2017
It has recently been demonstrated that high-power pulsed magnetron sputtering (HIPIMS) provides an alternative route for ion-assisted TM nitride film growth by using substrate bias synchronized to the...
Article - 2 Apr 2002
Physical properties of titanium and titanium alloys such as density strength, thermal conductivity, electrical resistivity, magnetic properties, elastic modulus, poissons ratio, tensile strength,...
Article - 20 Aug 2019
This article discusses how to use ATR to study coated SI Wafers from Harrick Scientific.
Article - 4 Oct 2017
This article shows how the Optistat™Dry Cryofree® cryostat from Oxford Instruments is used to characterize the c-Si/Al2O3 interface with the nonlinear optical technique of second-harmonic generation...
Article - 27 Sep 2016
Polymer brush systems are made up of ordered assemblies of polymeric chains that are terminally absorbed or grafted onto an interface and surface at one or more tethering points.
Article - 22 Jul 2015
Quadrupole mass-spectroscopy has reported significant neutral and ionic species in the unique C5HF7/O2/Ar plasma, including CxFy (X>2), CxHFy, and CxFy (Y/X
Article - 17 Jun 2015
In the foundry industry, where a high level of economic efficiency is required, the increasingly stringent quality requirements need specific requirements in terms of operational behavior and material...
Article - 16 Jun 2015
Ellipsometry is a traditional method of monitoring and measuring the thickness of silicon dioxide laid over silicon substrate, in the semiconductor industry.