Article - 29 May 2017
It has recently been demonstrated that high-power pulsed magnetron sputtering (HIPIMS) provides an alternative route for ion-assisted TM nitride film growth by using substrate bias synchronized to the...
Article - 2 Apr 2002
Physical properties of titanium and titanium alloys such as density strength, thermal conductivity, electrical resistivity, magnetic properties, elastic modulus, poissons ratio, tensile strength,...
Article - 20 Aug 2019
This article discusses how to use ATR to study coated SI Wafers from Harrick Scientific.
Article - 27 Sep 2016
Polymer brush systems are made up of ordered assemblies of polymeric chains that are terminally absorbed or grafted onto an interface and surface at one or more tethering points.
Article - 22 Jul 2015
Quadrupole mass-spectroscopy has reported significant neutral and ionic species in the unique C5HF7/O2/Ar plasma, including CxFy (X>2), CxHFy, and CxFy (Y/X
Article - 17 Jun 2015
In the foundry industry, where a high level of economic efficiency is required, the increasingly stringent quality requirements need specific requirements.
Article - 16 Jun 2015
Ellipsometry is a traditional method of monitoring and measuring the thickness of silicon dioxide laid over silicon substrate, in the semiconductor industry.
Article - 26 Mar 2013
Silicon is the second most abundant element on Earth, and is used extensively in integrated circuits, which form the basis of computers and other electronic devices - to a large extent our whole...
Article - 22 Nov 2010
In this paper, we have focused our attention on the photoluminescence studies of ZnO films at different deposition parameters. The films show the luminescent properties in UV, green-yellow, orange,...
Article - 17 Jan 2010
Structural integrity is concerned with determining and predicting the performance, failure, durability and safety of the component fabricated from the material that is subjected to a range of...