WITec is the leading manufacturer of confocal and scanning-probe microscopes for state-of-the-art Raman, Atomic Force (AFM), and Scanning Near-Field Optical Microscopy (SNOM). WITec’s...
Article - 12 Mar 2006
Atomic Force Microscopy can be used for in-situ monitoring of structural changes induced by thermal transitions, and for visualization of structure transformations caused by swelling and other effects...
Article - 11 Mar 2002
The unique properties of supercritical fluids have lead to their use in nanomaterial production for applications such as biomaterials, foams, high internal phase emulsions, lithography and metal...
News - 8 Dec 2016
The latest finding from a group of scientists, headed by Yang Zhang, assistant professor of Nuclear, Plasma, and Radiological Engineering and Beckman Institute for Advanced Science and Technology,...
News - 14 Apr 2006
As the United States’ oil reserves dwindle, some say the nation will have to rely on synthetic petroleum fuel made from its large stores of coal.
A two-step chemical process augments a method...
Article - 2 Mar 2011
By integrating a Raman spectrometer within a state-of-the-art confocal microscope setup, Raman imaging with a spatial resolution down to 200 nm laterally and 500 nm vertically can be achieved using...
Article - 13 Apr 2017
Conventional electronic noses or eNoses produce an identifiable response pattern using a group of dissimilar but not specific chemical sensors.
News - 15 Mar 2009
The process to turn propane into industrially necessary propylene has been expensive and environmentally unfriendly. That was until scientists at U.S. Department of Energy's Argonne National...
Article - 20 Jul 2016
Fuel is traditionally extracted from crude oil or petroleum. Petroleum contains six different types of substances. The mixture’s composition is specific to the region or area where the oil occurs.
Article - 6 Dec 2017
WITec manufactures high-performance instrumentation for both industrial and scientific applications focused on innovative solutions for Scanning and Optical Probe Microscopy.