Article - 9 Apr 2008
Universal testing machines (UTMs) that test mechanical properties such as tensile, flexural, compressive and shear are among the most commonly used instruments.
Article - 12 Feb 2008
The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to equipment and expertise to accelerate product commercialisation using techniques such as surface...
Article - 1 Jun 2007
Keithley Instruments offers a wide range of test solutions for companies developing and manufacturing optoelectronic components for telecommunications and other optical applications. Keithley test...
Article - 11 May 2007
El-Mul’s product line of top-quality particle detectors enjoys an excellent reputation as off-the-shelf or OEM components. El-Mul provide solutions for those in the semiconductor manufacturing,...
Article - 1 May 2007
Spectroscopic ellipsometry is used to characterize the thickness and optical constants of complex ferroelectric stacks with high accuracy and precision.
Article - 30 Apr 2007
Spectroscopic ellipsometry offers highly accurate characterization of TFT-LCD display panels based on a-Si and LTPS technologies.
Article - 20 Apr 2007
Solar cell research is on making solar cells cheaper and more efficient.
Article - 19 Apr 2007
Phase change optical recording is used for CD and DVD rewritable discs data storage.
Article - 11 Dec 2006
A comprehensive list of LSM Analytical's services are provided along with details of how they work.
Article - 18 Jul 2006
The formation of a cylinder-like helical conformation induced by chloroform was observed from a conjugated polymer, which was prepared by Knoevenagel condensation using N-octyl-3, 6-diformylcarbazole...