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Results 1 - 10 of 324 for Artefacts
  • Supplier Profile
    Vince Carlino founded ibss Group, Inc. in 2002, to turn brilliant ideas into affordable tools. In 2007 ibss Group began cooperating with an inventor of a unique, patented plasma source. ibss Group...
  • Supplier Profile
    Photothermal Spectroscopy Corp (PSC) is a spin-off from Anasys Instruments Corp, the company that pioneered the field of AFM-based photothermal IR spectroscopy (PTIR) and was eventually acquired by...
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    Non-Invasive Optical Oxygen Analyzers and Permeation Testing Solutions OxySense is the international leader in optical oxygen sensor systems for the packaging, packing and processing industries....
  • Supplier Profile
    ZYGO designs, manufactures, and distributes high-end optical systems and components for metrology and end-user applications. ZYGO's metrology systems are based on optical interferometry measuring...
  • Supplier Profile
    The Microscopy business group at Carl Zeiss is the world's only manufacturer of light, X-ray, electron, and ion microscopes. The company's extensive portfolio enables industrial, research and...
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    Thermo Fisher Materials and Structural Analysis products give you outstanding capabilities in materials science research and development. Driving innovation and productivity, our portfolio of...
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    Founded in 1991 by a group of managers and engineers from Tesla with its electron microscopy history starting in the 1950’s, today TESCAN is a globally renowned supplier of Focused Ion Beam...
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    DECTRIS is the first company worldwide to sell novel hybrid-pixel X-ray detector systems which operate in single-photon counting mode. This new technology features a very high dynamic range, a short...
  • Supplier Profile
    At the overlap between the worlds of science and industry, CORDOUAN Technologies was born in September 2007 from the impetus of David Jacob (CTO) and Mathias Pennec (CEO), originating respectively...
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...