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Results 1 - 10 of 614 for Atomic Force Microscopy
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    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
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    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D...
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    HORIBA, headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA is a world...
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    WITec GmbH pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without compromise. Raman,...
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    Independent Polymer Technology Ltd. or Ipolytech provide consultancy, testing and analysis services to material suppliers, converters and all end user sectors. Based in the UK with extensive testing...
  • Article - 12 Mar 2006
    This article compares Atomic Force Microscopy-based surface potential measurements with electrochemical potential measurements made in bulk electrolytes, and helps establish the value and usefulness...
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    Metrohm is a worldwide leading manufacturer of precision instruments for chemical analysis. In the field of electrochemical ion analysis we have been the unchallenged world number one for many years....
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    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Article - 12 Mar 2006
    Atomic Force Microscopy can be used for in-situ monitoring of structural changes induced by thermal transitions, and for visualization of structure transformations caused by swelling and other effects...
  • Article - 12 Mar 2006
    Scanning probe microscopes have been developed that can measure electrical currents, resistance, and capacitance.

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