Article - 9 Mar 2016
The development and commercialization of photovoltaic (PV) cells is being carried out rapidly. Manufacturers of wafer cells and modules are expected to manufacture panels that are extremely reliable...
Article - 19 Mar 2014
Low temperature black bodies are useful for calibrating and characterizing near ambient devices. Typical low temperature black body components are shown in Figure 1.
Article - 27 Jan 2014
In the automotive sector, test standards are an important factor where clutches, brakes, tires, engines, seatbelts, etc. are checked for their material properties to comply with a number of standards...
Article - 14 Jul 2011
Manufacturers of solar cells need to make sure their products are of the highest quality. To check this they carry out microstructural examinations. This article describes how to prepare samples for...
Article - 23 Dec 2010
The innovation of carbon nanotubes and coils shows highly useful electrical properties. Their nanostructured geometry equips them in efficient nanoelectronic devices leading to many industrial...
Article - 23 Feb 2007
HALSIC is the name of four exceptional high performance ceramics from the silicon carbide (SiC) material group made by W. HALDENWANGER.
Article - 7 Oct 2005
Aluminum Nitride (AlN) is a important substrate material in electronic devices. AlN powders can become contaminatedby oxygen i9f they come into contact with water or oxygen. Hydrolysis behaviour and...
Article - 21 Sep 2005
Excessive grinding forces acting on grinding surfaces cause defects during grinding of fragile materials. A new grinding system (regulated force feeding, RFF) has been developed in order to minimize...
Article - 19 Sep 2005
Porous silicon carbide candle-type filters suitable for the condition of pressurized fluidized-bed combustion (PFBC) operations were prepared by several processes. Filtering characteristics of the...
Article - 20 Jan 2005
This case study compares dynamic light scattering to other methods such as transmission electron microscopy and x-ray diffraction for the determination of particle size for Cadmium Selenide...