Article - 8 Jan 2004
Density date is provided for Lanthanum Hexaboride (LaB6).
Article - 6 Jan 2021
In this interview, AZoM speaks to Vern Robertson, EPMA Product Manager at JEOL USA, about the benefits of using a low kV in SEM imaging.
Article - 3 Jun 2020
CS of Pt nanoparticles in Pt/C catalysts can be easily determined using the benchtop ARL EQUINOX 100 X-ray Diffractometer.
JEOL USA is a wholly-owned subsidiary of JEOL Ltd in Japan, a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core...
Article - 29 Jan 2015
The column design of scanning electron microscopes has included an electron gun, objective lens, an aperture or aperture strip, and a condenser lens.
The JEOL JEM-1400 series 120 kV Transmission Electron Microscope is widely accepted for its ease of use and high-resolution imaging and analysis.
Article - 14 Jun 2018
The SEM is an instrument that uses a focused beam of electrons to scan a rectangular area of the tested specimen, and generate an image.
Article - 16 Nov 2010
The field of forensic investigation is of increasing importance and thus the role of the Scanning Electron Microscope (SEM) becomes progressively more significant.
Article - 13 Jun 2009
The LYNXEYE™ is a 1-dimensional detector for X-ray diffraction, based on Bruker AXS' compound silicon strip technology. Compared to a simple point detector the LYNXEYE dramatically increases measured...