Search

Search Results
Results 31 - 40 of 697 for Microelectronics
  • Supplier Profile
    Mantracourt was founded in 1974 with the clear objective of becoming a leader in the application of microelectronics to industrial measurement applications. Ever since, Mantracourt have demonstrated...
  • Supplier Profile
    Angstrom Sciences was founded in 1988 by Mark A. Bernick with a corporate mission to supply the most advanced magnetron sputtering cathodes and high purity materials for plasma vapor deposition of...
  • Supplier Profile
    For nearly 30 years, RJ Lee Group, Inc. has excelled at providing analytical services, technical consulting, information management, and expert testimony in materials characterization and forensic...
  • Supplier Profile
    Instron is a leading provider of testing equipment for the material testing and structural testing markets. Instron’s products test the mechanical properties and performance of various...
  • Supplier Profile
    Anton Paar was established in 1922 as a one-man  locksmith’s workshop. Today, over 3200 employees worldwide develop, produce and distribute highly accurate laboratory instruments and...
  • Supplier Profile
    Bruker Nano Surfaces provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and 3D surface...
  • Supplier Profile
    HORIBA Scientific, part of HORIBA Instruments, Inc., headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific...
  • Article - 27 Oct 2008
    STM can form an image of individual atoms on a metal, semiconductor, or other conductive sample surfaces.
  • Article - 28 Oct 2008
    The scanning tunnelling microscope (STM) and atomic force microscope (AFM) provide pictures of atoms on or in surfaces.
  • Article - 27 Oct 2008
    Scanning near-field optical microscopy gives an ability to study optical properties of the sample with the resolution of tens of nanometer.