Article - 29 Jun 2015
Many different industries use optical profilers for precision 3D measurements. This article provides the comparison of ZDot™ optical profiling technology, a patented solution from Zeta Instruments,...
Article - 22 Apr 2015
Optical profilers provide precision 3D measurements and are used by numerous industries. Various designs provide distinct strengths and weaknesses. In this article, KLA's patented ZDot™ optical...
News - 21 Feb 2019
Engineered Material Systems, Inc., a leading global supplier of negative photoresist materials, is pleased to announce the availability of its NR-5000 series liquid negative photoresists for...
News - 17 Dec 2011
Dolomite, a company specializing in microfluidic devices for the analysis and control of small-scale fluids, has expanded its portfolio of system solutions with the introduction of an advanced...
News - 23 Sep 2009
Inventing a useful new tool for creating chemical reactions between single molecules, scientists at the National Institute of Standards and Technology (NIST) have employed microfluidics-the...
Article - 27 Jan 2014
Optical profilers that employ white light interferometry are one of the most accurate and flexible metrology tools for precision three-dimensional surface characterization. They are instrumental in an...
Article - 7 Feb 2012
The two techniques utilized to achieve deep etches in the fabrication of micro-electro-mechanical systems (MEMS) are the Cryogenic and Bosch Process. These processed are reviewed herein.
News - 8 Aug 2019
Polyplastics, one of the global suppliers of engineering thermoplastics jointly with TOPAS COCs will showcase the recent advancements in material technologies and products at the upcoming K 2019; with...
News - 25 Aug 2015
Researchers at the University of Massachusetts Amherst have formulated a new method based on the natural “snapping” systems, such as Venus flytrap leaves and hummingbird beaks, to apply...
News - 30 Mar 2011
Using a small block of aluminum with a tiny groove carved in it, a team of researchers from the National Institute of Standards and Technology (NIST) and the Polytechnic Institute of New York...