Article - 4 May 2018
Many microdevices (such as accelerometers, sensors and mechanical parts) are composed of silicon fused with glass. Contamination is a large risk to these devices, as they are hypersensitive to a...
Article - 13 Jun 2017
Analysis of the Surface of Lithium Ion Batteries atomic-layer deposition (ALD) using conventional surface analysis techniques of XPS and sputter depth profiling
Article - 13 Mar 2017
Here's why Sierra's Laminar Flow technology was ideal for measuring gas mixing.
Article - 20 Jun 2016
High-resolving power at low masses is required in several critical applications in the industrial and academic sectors. These include the determination of hydrogen isotopes in the presence of helium...
Article - 4 Nov 2013
AZoM talks to Jason Byrne, Product Manager for the Oxygen range at Michell Instruments, to find out more.
Article - 30 Apr 2009
Seven commercial Si3N4 powders produced by different production processes, nitridation media and further acid treatments were analyzed by XPS technique. The XPS spectra of all as received powders show...
Article - 18 Jan 2007
In this paper, the structural changes with temperature of 8CB-free standing film liquid crystal and 8CB-BULK are discussed by molecular dynamics (M)D simulation. The temperature dependence of order...
Article - 4 Nov 2016
The cycling nature of Salt Valley Generating Station created a series of problems related to operating and layup chemistry, corrosion, and layup procedures.
Article - 8 Apr 2014
Plasma treatment can be used to modify surface chemistry in materials via functional groups introduced by the plasma gas.
Article - 5 Aug 2010
The TriStar® II Series are fully automated, three-station, surface area and porosity analyzers that deliver high-quality data at an affordable price.