Nanotechnology Measurement Solutions
Whether your application requires a high-resolution system that offers modularity and cross-platform compatibility for atomic force microscopy (AFM) and scanning probe microscopy (SPM), a nanoindenter or universal testing machine (UTM) optimized for high-precision nanomechanical characterization, or a compact, low-voltage system that delivers exceptional field emission scanning electron microscopy (FE-SEM) performance, Agilent is committed to providing the right state-of-the-art instrumentation for your work.
When you choose Agilent, you’re choosing a reliable partner with a long history of nanomeasurement innovation. Agilent was the first to offer SPM for imaging in fluids and controlled environments, a technological legacy that continues to manifest itself in a wide range of superior solutions for in-fluid and soft-sample imaging. Agilent holds more than 40 AFM related patents and our leading-edge R&D is committed to the pursuit of advancements that will make atomic force microscopy easier to use. More than 2,500 peer-reviewed papers have been published using Agilent AFM technology, further validating its high performance and versatility.
The pedigree of our nanomechanical test instrumentation is equally impressive. For instance, the seminal paper authored by Warren Oliver and George Pharr has now surpassed 5,000 citations, making it the most frequently cited paper for nanomechanical properties of materials.
Every Agilent nanomeasurement solution is backed by a team of knowledgeable application scientists and technical service personnel, all of whom strive to provide outstanding support to our customers around the world. Agilent offers invaluable application expertise for life science, materials science, polymer science, electrochemistry, and cross-disciplinary nanoscale research.