NanoMagnetics presents a unique way for Quantitative and Non-Invasive magnetic imaging with Scanning Hall Probe Microscope (SHPM).
NanoMagnetics offers another well known magnetic imaging technique: Magnetic Force Microscope. LT-MFM can be operated down to <300 mK extreme temperature ranges for better spatial resolution requirements <50 nm. Our alignment free sensor designs with fiber interferometer deflection measurement technique provides you easy MFM operations as well as Scanning Spreading Resistance Microscope (SSRM), Electrostatic Force Microscope (EFM), and Contact, Non-Contact and Semi-Contact mode AFM operations.