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Results 1 - 10 of 589 for Atomic force microscopy
  • Veeco
    Supplier Profile
    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D...
  • HORIBA
    Supplier Profile
    HORIBA, headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA is a world...
  • WITec GmbH
    Supplier Profile
    WITec GmbH pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without compromise. Raman,...
  • Independent Polymer Technology - Ipolytech
    Supplier Profile
    Independent Polymer Technology Ltd. or Ipolytech provide consultancy, testing and analysis services to material suppliers, converters and all end user sectors. Based in the UK with extensive testing...
  • High-Resolution Surface Potential Measurements and Imaging with an Atomic Force Microscope
    Article - 12 Mar 2006
    This article compares Atomic Force Microscopy-based surface potential measurements with electrochemical potential measurements made in bulk electrolytes, and helps establish the value and usefulness...
  • Renishaw plc - Spectroscopy
    Supplier Profile
    Renishaw is a global company with core skills in measurement, motion control, additive manufacturing and precision machining. The company also specialises in the production of high quality optical...
  • Molecular Vista
    Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Imaging and Mapping Trends For Polymer Materials - Atomic Force Microscopes
    Article - 12 Mar 2006
    Atomic Force Microscopy can be used for in-situ monitoring of structural changes induced by thermal transitions, and for visualization of structure transformations caused by swelling and other effects...
  • Using Veeco Scanning Probe Microscopes for Electrical Property Characterization
    Article - 12 Mar 2006
    Scanning probe microscopes have been developed that can measure electrical currents, resistance, and capacitance.

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