Materials Characterization Using IMA EL™ Hyperspectral Microscope from Photon etc.

Photon etc.’s IMA EL™ hyperspectral microscope is specifically designed for electroluminescence characterization of a wide variety of materials. The instrument is suitable for the analysis of semiconductors and photovoltaic cells.

Key Features

The main features of the IMA EL™ are:

  • High spatial and spectral resolution
  • Non-destructive analysis
  • Fast global mapping (non scanning)
  • Complete system with microscope, source, camera, filter, and software
  • Customization available


The main applications of the IMA EL™ are:

  • Thin films – Magneto-optical effects are suitable for providing in-situ measurements of the magnetization characteristics of thin-films.

  • Photovoltaic – A novel characterization technique based on hyperspectral imaging recording spectrally resolved images enables the cartography of photoluminescence and electroluminescence.

  • Defects on SiC – ideal for studying electroluminescent materials; can be utilized to obtain spatial and spectral information of the defects concurrently.


Spectral Range 400 - 1000 nm
Spectral Resolution < 2.5 nm
Spatial Resolution Sub-micron
Microscope Upright, modular
Objectives 20×, 50×, 100×
Camera Front-illuminated interline CCD
Maximum Sample Format 4" x 4" (10 cm x 10 cm)
X, Y Travel Range 76 mm x 52 mm
Z Stage Resolution 1 µm
Maximum Scanning Speed 150 ms
Wavelength Absolute Accuracy 0.25 nm
EL module Electroluminescence probes
Video Mode Megapixel camera for sample visualisation
Preprocessing Spatial filtering, statistical tools, spectrum extraction,
data normalization, spectral calibration
Hyperspectral Data Format FITS, HDF5
Single Image Data Format JPG, PNG, TIFF, CSV, PDF, SGV
Software Computer with PHySpecTM control and analysis software included
Dimensions  ≈ 30" x 30" x 30" (76 cm x 76 cm x 76 cm)
Weight ≈ 80 Kg
Spectral range extension 250-400 nm, FWHM 15 nm
Camera HI Low-noise back-illuminated camera
Broadband COL camera Color camera


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