Latest Equipment

MiniPal 2 Benchtop EDXRF Spectrometer from PANalytical The PANalytical cost-effective MiniPal 2 benchtop EDXRF spectrometer is a valuable tool for stand-alone or satellite units. Especially in those conditions where sample throughput is low (typically 20 samples per day) and an adequate analysis is demanded. With its portability it is also a practical choice for sample pre-screening or as back-up to other main-line systems. MiniPal 2 makes elemental analysis easy. Read more

MiniMill 2 Sample Preparation System from PANalytical With the compact MiniMill 2, samples can be ground at low cost with a high degree of reproducibility. The bench-top MiniMill 2 is based on the principle of planetary ball mills with just one grinding bowl holder. Grinding bowl in sizes 80 - 500ml. speeds of up to 600rpm, new electronic system with timer and programmable reversing unit, short grinding times and high fineness ratings make the MiniMill 2 an ideal sample preparation tool for subsequent spectro-analytical work. Read more

AxiosmAX X-Ray Fluorescence XRF Spectrometer by PANalytical Already the world’s most popular X-ray fluorescence (XRF) spectrometer, PANalytical’s proven Axios wavelength dispersive family of instruments has been upgraded to AxiosmAX with the incorporation of the SST-mAX X-ray tube in the standard configuration. Read more

Paper Analysis Using the Phenom Desktop Scanning Electron Microscope SEM The process of turning raw cellulose fibers into finished paper products requires sophisticated lab tools to evaluate paper composition, bonding properties, coatings thicknesses and surface uniformity throughout the development and manufacturing process. Read Article

Bridging the Gap between Light and Scanning Electron Microscopy with the Phenom Desktop SEM The rapidly accelerating pace of development in microscope and nanotechnologies has created growing demand for imaging capability beyond the 1000x magnification available from a typical light microscope (LM). Read Article

Pharmaceutical Particle Inspection Using the Phenom Desktop Scanning Electron Microscope SEM The Phenom's intuitive touch-screen controls and never-lost sample navigation features remove the difficulties associated with operating a traditional SEM. Read Article

Metallurgical Inspection Using the Phenom Desktop Scanning Electron Microscope SEM The properties of many engineering materials are mostly governed by a combination of metal composition and the morphology and distribution of key microstructural features. Read Article

Forensic Analysis Using the Phenom Desktop Scanning Electron Microscope SEM The Phenom is a desktop scanning electron microscope (SEM) which combines the high magnification of electron microscopy with the ease of use of optical microscopy to improve performance in a tabletop instrument. Read Article

Automated Nanofiber Analysis with the Fibermetric System from Phenom World The advent of nonwoven nanofibers is enabling the development of a new generation of highly sensitive filters. Read Article

Imaging and Classification of Diatoms Using the Phenom Desktop Scanning Electron Microscope Diatoms provide information on both the biological integrity of the ecosystem and those factors likely to be causing any observed changes. Read Article

Analysis of Tin Whiskers with the Phenom Desktop Scanning Electron Microscope SEM Recent legislation by many countries has banned the use of heavy metals such as lead, cadmium, and mercury. Read Article

Polymer Property Determination by ipolytech Combining our knowledge of FEA and the mechanical performance of polymeric materials we are able to generate reliable data for FEA input. Read Article

Plastic Product Evaluation Services Offered by ipolytech ipolytech have experience of working with clients from a wide variety of industry sectors to ensure that their products are fit for purpose. Read Article

Polymer Identification and Optimal Materials Selection Services Offered by ipolytech Using the wrong type of plastic for a particular product can be an expensive and sometimes dangerous mistake to make. Read Article

Polymer Design and Development Services Offered by ipolytech ipolytech work in conjunction with design teams to accelerate the design process and ensure products are designed for long term durability. Read Article

Analysis of Polypropylene Sealing Surfaces Using Atomic Force Microscopy AFM – ipolytech AFM is a form of scanning probe microscopy. The AFM probe has a very sharp tip, at the end of a small cantilever beam. Read Article

Regrind Polyethylene Contamination Analysis – ipolytech A manufacturer using regrind polyethylene material experienced difficulties with contamination of screen plates within an extruder. Read Article

Failure Analysis of a Nylon Power Board – ipolytech ipolytech have extensive experience in polymer failure analysis of products manufactured from all major thermoplastic materials over all end user sectors. Read Article

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