JEOL, Ltd., announces a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes.
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Many components and assemblies have internal features that are difficult to inspect non-destructively, as conventional metrology requires them to be sectioned.
Thin-film electroluminescent displays (TFEL) have been used in specialist applications for around 30 years. Now, thin-film specialist Beneq has entered the market, using their advanced technology to create advanced TFEL displays under the Lumineq brand.
Graphene, the one atom thick layer of graphite, has proven to be an exciting substance in the development of advanced materials.
Using a novel flexible polymer, researchers have successfully created a battery electrode that is self-healing; a breakthrough which could have major implications for the next generation of electric cars.
Nick Fecitt, Technical Director of International Syalons, talks to AZoM about the unique properties and applications of Sialon ceramic alloys.
AZoM talks to Juergen Blumm, Managing Director of Sales, Service and Marketing at NETZSCH, about the need for Differential Scanning Calorimetry (DSC) in the thermal analysis of polymers.
AZoM talks to Chris Andrews from Artemis CCD discussing the latest innovations in CCD technology at Artemis CCD Ltd.
AZoM talks to Daniel P. Walsh, Director of Product Management, Spectro Inc., as he gives an introduction to the Q5800 fluid analysis system and its application in the military, marine and mining sectors.
In this in-depth Insight from Industry Nick Gilbert from AZoM talks with Dr. Mike Bradley from Thermo Scientific about their exciting iN10 FT-IR Microscope.
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