Elemental Analysis at the Nanoscale with EDS Detectors for TEM

QUANTAX EDS for TEM includes the XFlash® 7T, the latest generation of EDS detectors from Bruker Nano Analytics. 

  • 80 keV upper energy limit - Identify and quantify all elements present
  • 1 Å stable resolution with drift correction for the mapping of periodic structures, such as atoms and layers, at the nanoscale
  • 3 powerful TEM quantification methods to suit different applications – theoretical and experimental Cliff-Lorimer factors as well as Zeta-factor interpolation

QUANTAX EDS for TEM systems collect spectra at the maximum collection and take-off angle for fast and highly sensitive data acquisition, allowing users to achieve maximum throughput. As the system avoids any mechanical and electromagnetic interference, tilting of the specimen, and minimizes shadowing and system peaks, the collected data is clean and requires little or no post-acquisition corrections. In addition, an enhanced drift correction feature allows for high-resolution nanoscale measurements to be taken quickly using a fast and stable detector stage.

The XFlash® 7T has a slim-line design and geometrical optimization for each flange type and microscope pole piece, helping provide users with the best configuration for their measurements.

Bruker’s established background in the field of EDS with tried-and-tested quantification methods helps ensure unambiguous results with either the automated collection of data for batch processing or collection using API options for specific measurements. Time-resolved data collection is also possible for in-situ experiments with data that changes over time, such as temperature ramping experiments.

The experts in Bruker Nano Analytics’s EDS team will help ensure that the detector and microscope (TEM, STEM or T-SEM) configuration is tailored for each user’s application. Training can also be provided to ensure that users can run their system at its full potential. 

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ESPRIT Software 

QUANTAX EDS for TEM uses ESPRIT software for the collection, processing and interpretation of data. 

  • Quantification step options which include default recommendations for simple use, individual setup, in-depth adjustment, and saving/reloading of methods.
  • Three different quantification methods to cover all possibilities: Theoretical and experimental Cliff-Lorimer factors, Zeta-factors, and the estimation of Zeta-factors.
  • TEM-specific high-energy element lines exceeding 40 keV included to ensure definite conclusions.
  • Choose between three EDS background models, including a mathematical model, a physical model for thick lamellae, and a physical model for bulk materials.
  • Cliff-Lorimer measurement including pre-set absorption correction.

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