Equipment | Electrical Properties | Electrical Properties Characterization Equipment

Electrical Properties Characterization Equipment

Many materials are used in aplications due to their electrical properties such as semiconductors. These properties might include capacitance, conductivity, resistivity, dielectric constant, permittivity, piezoelctric constant, seebeck co-efficient, permeability (electromagnetic) etc. The instruments described below have been designed to characterize these properties to aid in the optimum selection of materials for a given application as well as to test their performance
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Equipment
Model 1260A Impedance / Gain-Phase Analyzer By Solartron
The model 1260A Impedance/Gain-Phase Analyzer is - without doubt - the most powerful, accurate and flexible Frequency Response Analyzer available today. In daily use by leading researchers wherever measurement integrity and experimental reliability are of paramount importance, the 1260A’s solid reputation is frequently endorsed in published research papers in Many fields.
Model 129610A LHe/LN2 Cryostat System By Solartron
Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with cryogenic experts Janis Research Company Inc., to produce an advanced cryogenic materials characterization test system
ModuLab-MTS System for the Electrical Characterization of Materials By Solartron
The ModuLab MTS is a new concept in testing the electrical properties of materials. The system uniquely combines time domain tests (I-V, pulse, ramp), and AC tests (C-V, Mott-Schottky, impedance, permittivity), together with a wide range of modules providing high voltage, high current resolution, sample / reference measurements. Temperature control and sample holder accessories add to the capabilities of the system.
Model 370 Scanning Electrochemical Workstation By Solartron
The Model 370 Scanning Electrochemical Workstation is a new concept in Scanning Probe Electrochemistry designed for ultra-high resolution, spatially resolved electrochemical and non-contact surface topography measurements
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