Scanning Kelvin Probes RSS Feed - Scanning Kelvin Probes

The theory of the Kelvin Probe was first promoted by Lord Kelvin in 1861. The Kelvin probe technique is a non-destructive test method that uses the work function to detect differences across the surface of a sample and can detect such things as adsorbed layers, surface charges, surface contaminants, coating discontinuities etc. It involves the use of a vibrating capacitance probe and measures the difference in potential between it and the sample surface.
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Equipment
The SECM combines a positioning system, a bipotentiostat, and an ultramicroelectrode tip. The tip is moved close to the sample surface by the positioning system.
The SKP5050 is a comprehensive Kelvin Probe solution for researchers looking to carry out scanning measurements on their samples; it comes with everything needed to produce reliable, repeatable results, due to the unique features provided by the ‘Baikie System’. The SKP5050 provides a scan area of 50mm by 50mm and can record up to 80 by 60 points in any one measurement.
The KP020 comes with everything needed to produce reliable, repeatable results, due to the unique features provided by the ‘Baikie System’. It is the ideal Kelvin Probe system for researchers that do not need a scanning function. In any one measurement the KP020 will record up to 40,000 data points.
The SKP5050 with RHC020 is the ideal Kelvin Probe system for researches looking to investigate samples in a controlled atmosphere with the option of increasing sample temperatures up to 90°C.This system includes everything the researcher needs to produce reliable, repeatable results, due to the unique features provided by the ‘Baikie System’.
KP-6000 Digital Kelvin Probe is part of the Digital Kelvin Probe System which is a vibrating capacitor technique used to measure the change in work function of metals, semiconductors and liquids. The Kelvin method has extremely high surface sensitivity (<0.1 meV, typically corresponding to 10-3of an adsorbate layer) and is completely non-damaging, even to the most sensitive adsorbates. It enjoys wide ranging applications in physics, bio-chemistry, engineering and, most recently, as a UHV surface analysis technique.
The UHVKP020 is a complete Kelvin Probe solution for researchers investigating in Ultra High Vacuum. This system includes everything the researcher needs to produce reliable, repeatable results, due to the unique features provided by the 'Baikie System'. The UHVKP020 records up to 40,000 data points in any one measurement.
The SKP5050 with SPV020 is a comprehensive Kelvin Probe solution for researchers looking to carry out scanning measurements on their light sensitive samples; it comes with everything needed to produce reliable, repeatable results, due to the unique features provided by the ‘Baikie System’.