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A New Guide for Advanced Techniques in Materials Characterization

Carl Zeiss Opens Technical Center for  High-Tech Industry

Carl Zeiss Opens Technical Center for High-Tech Industry

Appalachian State University Win $500K Grant to Buy State of the Art TEM-STEM

FEI Release New SEM's with Automated Gun Shot Residue Analysis for Forensic Scientists

New Method for Measure Pore Size Distributions from Whitehouse Scientific

New Method for Measure Pore Size Distributions from Whitehouse Scientific

Lambda Photometric Introduce Automated Nano and Micro Fiber Chartacterisation System

Lambda Photometric Introduce Automated Nano and Micro Fiber Chartacterisation System

Inaugural International Conference on Surface Metrology to Take Place in October

Masdar Institute of Science and Technology to Use Asylum Research AFM for Development of Thin Film Photovoltaics

Masdar Institute of Science and Technology to Use Asylum Research AFM for Development of Thin Film Photovoltaics

CRAIC Introduce New UV-Visible-NIR Microspectrophotometer for NDT of Microscopic Samples

CRAIC Introduce New UV-Visible-NIR Microspectrophotometer for NDT of Microscopic Samples

Real Time Particle Size Analysis Slashes Energy Consumption and Improves Cement Quality

Real Time Particle Size Analysis Slashes Energy Consumption and Improves Cement Quality

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