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PANalytical Offers Free Webinar on Total Scattering Technique and PDF Analysis

PANalytical Offers Free Webinar on Total Scattering Technique and PDF Analysis

PANalytical, the world’s leading supplier of analytical instrumentation and software for X-ray and related techniques, organizes a free webinar on total scattering technique and PDF analysis taken place on 29 April 2014, presented by Marco Sommariva, Application Specialist XRD, PANalytical B.V., the Netherlands. [More]
Mecmesin Launch New Helixa Torque Tester for Finely Engineered Components

Mecmesin Launch New Helixa Torque Tester for Finely Engineered Components

New from Mecmesin, the Helixa precision torque tester has been designed for achieving precise alignment when using the most sensitive torque sensors. It is a significant development in the torque testing of finely engineered components. [More]
Malvern Instruments Experts to Present New Ways of Accelerating Development of DPI Formulations

Malvern Instruments Experts to Present New Ways of Accelerating Development of DPI Formulations

At the Respiratory Drug Delivery (RDD) 2014, specialists from Malvern Instruments will present a new approach to help accelerate the development of dry powder inhalation (DPI) formulations. [More]
WIRE-AOI Optical Inspection System Detects Micro-Defects in Strip Products in Real Time

WIRE-AOI Optical Inspection System Detects Micro-Defects in Strip Products in Real Time

The wire blank shoots from the drawing die which molds it into the desired shape. Up to ten meters per second, the workpiece is fast – and thus can keep pace with world-class runners like Usain Bolt. At these speeds, an in-line inspection – inspecting the workpiece during the production process – would have been inconceivable, until now. [More]
McPherson Introduces New Conical-Diffraction, Off-Plane X-ray Czerny-Turner

McPherson Introduces New Conical-Diffraction, Off-Plane X-ray Czerny-Turner

For sorting laser harmonics and other applications, McPherson (Chelmsford, MA) is pleased to present a new conical-diffraction, off-plane X-ray Czerny-Turner (OP-XCT). Designed for operation from 8 to 125 nm (10 to 150 eV), the OP-XCT operates as a monochromator or imaging spectrograph. With a coarse diffraction grating and CCD, it can survey a very broad EUV wavelength swath, dispersing from 10 to 140 nm on a detector 12 mm wide. [More]
OSRAM Places Order for Altatech’s Orion LedMax Wafer Inspection and Metrology System

OSRAM Places Order for Altatech’s Orion LedMax Wafer Inspection and Metrology System

Altatech, a subsidiary of Soitec, announced today that the company received an order for its Orion LedMax wafer inspection and metrology system from OSRAM Opto Semiconductors GmbH, one of the world's leading manufacturers of opto electronic components. OSRAM will use the tool to improve the performance, cost efficiency and yield of its LED-processing operations. [More]
Sandia Completes Full-Scale Wind Tunnel Test of B61-12 Gravity Bomb Mock-Up Unit

Sandia Completes Full-Scale Wind Tunnel Test of B61-12 Gravity Bomb Mock-Up Unit

Sandia National Laboratories has finished eight days of testing a full-scale mock unit representing the aerodynamic characteristics of the B61-12 gravity bomb in a wind tunnel. [More]
Compound Semiconductor Honors EMCORE with CS Industry Award for Terahertz Systems Technology

Compound Semiconductor Honors EMCORE with CS Industry Award for Terahertz Systems Technology

EMCORE Corporation, a leading provider of compound semiconductor-based components and subsystems for the fiber optics and space solar power markets, announced today that it has received Compound Semiconductor's 2014 CS Industry Award as a joint winner with Lake Shore Cryotronics in the metrology, test and measurement category for EMCORE's terahertz systems technology designed into the Lake Shore 8500 Series Terahertz (THz) System for Material Characterization. [More]
New Terahertz Optical Sampling System from Advantest

New Terahertz Optical Sampling System from Advantest

Leading semiconductor test equipment supplier Advantest Corporation announced today that it has started sales of a new terahertz optical sampling system, the TAS7400TS. The flexible design of the new system allows the user to freely configure the terahertz source and detector modules, creating unparalleled versatility. This system can be paired with a variety of terahertz source modules covering three different spectral ranges within the terahertz frequency band. [More]
Lake Shore to Showcase Its Range of Cryogenic Probe Stations at MRS Spring

Lake Shore to Showcase Its Range of Cryogenic Probe Stations at MRS Spring

Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announced today that it will showcase cryogenic probe stations and discuss its new fully integrated system for terahertz (THz) materials characterization at the upcoming MRS Spring Meeting & Exhibit in San Francisco, Calif. [More]