WITec
has just received the prestigious Photonics Prism Award 2011 for the development
of TrueSurface Microscopy.
Witec TrueSurface Microscopy system.
This internationally respected product innovation award recognizes
cutting-edge products that break conventional ideas and improve life through
photonics and is presented each year by SPIE and Photonics Media. In the
category of Test, Measurement & Metrology, TrueSurface Microscopy prevailed
over strong competition selected by an independent panel of judges. Winners were
announced at an award ceremony on 25. January 2012 during SPIE Photonics West in
San Francisco, one of the largest Photonics Exhibitions in the world.
True Surface Microscopy allows confocal Raman imaging guided by surface
topography. The topographic coordinates measured by an integrated profilometer
are used to perfectly follow the sample surface in confocal Raman imaging mode.
The result is an image revealing optical or chemical properties at the surface
of the sample, even if this surface is very rough or heavily inclined.
TrueSurface Microscopy has already received the PITTCON 2011 Editors Gold Award,
the R&D 100 Award 2011 and the Microscopy Today Innovation Award 2011.
"Receiving this award is a perfect start to the new year and a great
motivation for us to further establish TrueSurface Microscopy in the photonics
community and provide our customers with cutting-edge technology" says Dr. Klaus
Weishaupt, Managing Director, Marketing & Sales of WITec who accepted the
award at the gala event in San Francisco. "It is verification that our
established market approach of pioneering technology and continuous innovation
in advanced imaging solutions will extend our position as a leader in the field
of Raman and scanning-probe microscopy.