See the latest product developments in materials characterization research from Lake Shore Cryotronics, Inc, a manufacturer of scientific sensors, instruments, and systems for precise measurement and control, at the Materials Research Society Fall Meeting.
The Fall Meeting, an opportunity for professionals from all branches of materials research to convene and discuss the latest advances in the field, will be held from November 26-30, 2012 at the Hynes Convention Center in Boston, MA.
Lake Shore will be highlighting its wide range of sensors, instruments, and systems used for high-precision materials characterization research, including their line of cryogenic and cryogen-free probe stations, new 8404 Hall effect measurement system and Model 336 cryogenic temperature controller. Lake Shore experts will be available in booth #800 to discuss recent research developments, talk through any applications issues that scientists are encountering, and help suggest solutions to these issues.
Featured at the booth will be a Model TTPX probe station, an entry-level table-top micro-manipulated probe station used for non-destructive testing of materials. The TTPX is part of Lake Shore’s full line of cryogenic probe stations, designed to meet a wide variety of research needs. Lake Shore probe stations offer controlled environments for characterizing electronic and magneto-transport properties of materials from cryogenic to elevated temperatures, and are available with and without magnets. The line includes liquid cryogen-based stations or cryogen-free CCR-based units. Lake Shore’s application scientists will be available to discuss your research needs and suggest the best unit to fit your requirements.
Additionally, Lake Shore will be spotlighting the 8404 AC/DC field Hall effect measurement system and its new extended range sample oven, which enables researchers to evaluate the electronic transport properties of materials to temperatures as high as 1000C. A closed-cycle refrigerator option for measurements down to 15K is also available. The 8404 features an optional AC field measurement capability, which can measure mobilities down to 10-3 centimeters squared per volt second (cm2/V s), providing better solutions for researchers exploring the electronic and magneto-transport properties of low mobility electronic materials. Applications for the system include measurement of solar cell materials, organic electronics, transparent conducting oxides, III-V semiconductors and more.