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Nordson Corporation Awarded A 2013 Global Technology Award

Nordson DAGE, a division of Nordson Corporation (NASDAQ: NDSN), announces that it was awarded a 2013 Global Technology Award in the category of Inspection – X-ray for its enhanced XD7500VR Jade FP X-ray Inspection System.

The award was presented to the company during a Tuesday, November 12, 2013 ceremony that took place at the New Munich Trade Fair Centre in Munich, Germany during Productronica.

The new XD7500VR Jade FP provides superior X-ray image quality for all PCBA X-ray inspection applications in the value oriented market segment and uses the latest technology flat panel detector providing market-leading, cost effective approach where high quality real time imaging is needed for production tasks. The long lifetime CMOS digital detector with 1.3 Mpixels features 10 fps full-frame ‘real time’ image acquisition and real-time image enhancements for easier fault finding.

Premiering in 2005, the Global Technology Awards program is an annual celebration of product excellence in electronics surface mount assembly. Premier products based on the finest examples of creative advancement in technology are chosen by a distinguished panel of industry experts.

For more information about Nordson DAGE, visit www.nordsondage.com.

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