Apr 10 2014
Cascade Microtech, Inc., a leading supplier of solutions that enable precision measurements of integrated circuits at the wafer level, today announced that its CM300 Probe System was voted "Best in Test" in the category of Semiconductor Test.
The "Best in Test" awards are presented annually by EDN, part of UBM Tech's portfolio of communities for the electronics industry, to honor important and innovative new products and services in the electronics test and measurement industry.
Semiconductor manufacturers are facing demanding challenges in device design and test productivity, and are constantly under pressure to reduce test costs. Cascade Microtech is moving the industry forward with innovative solutions like the CM300 probe system which, when paired with advanced Pyramid Probe® technology, recently broke through the 25 um-diameter micro-bump barrier. The CM300's highly configurable and scalable platform provides upgrade paths for measurement capability, application flexibility and test automation. The CM300 automates on-wafer device measurements and enhances device and process characterization and modeling by capturing the true electrical performance of devices, enabling hands-off productivity.
Since its introduction in January of 2013, the CM300 has been selected for use in the engineering labs of major foundries, integrated device manufacturers and leading fabless companies. The product's flexibility and scalability are contributing to its early success in the market.
The CM300 probe system allows a high degree of measurement complexity and test flexibility to perform I-V, C-V and RF measurements over a broad temperature range. Future innovations, such as support for 1/f measurements, planned for the product will extend its capabilities. With fast and well-characterized thermal transition and probe-to-pad alignment, the CM300 processes a high volume of measurement data with accuracy on pads as small as 30 µm. The CM300's measurement automation, including the ability to reduce idle time while testing over a wide span of temperatures, improves throughput while delivering high volumes of reliable data. With Velox™ software, the CM300 enables fast wafer loading and easy test automation while preventing damage of probe tips, probe cards and customer wafers throughout the entire measurement cycle.
"Cascade Microtech takes pride in its legacy of innovation dating back 30 years," said Michael Burger, president and CEO of Cascade Microtech, Inc. "We are thrilled to be honored for product innovation in the Semiconductor Test category, and to be recognized for our commitment to delivering leading-edge solutions that help our customers address emerging test and measurement challenges."
Source: http://www.cascademicrotech.com