In the production of metals, ferroalloys are vital components, steel and iron smelters are leading users of ferroalloys. Ferrosilicon (FeSi) is one of the most largely utilized ferroalloys with a high rate of consumption.
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Presently, “wet chemistry” is the most common method used to carry out precise analysis of FeSi alloys. Yet, it has high labor costs and requires long sample preparation time.
For the analysis of FeSi alloys, X-ray fluorescence (XRF) spectrometry is an ideal alternative technique, providing high throughput and simple routine sample preparation.
When compared to “wet chemistry”, the analysis of FeSi alloys by XRF spectrometry, commonly measured as loose powders or pressed pellets, exhibits limitations in precision because of strong metallurgical and particle size influences in these varieties of samples.
If samples are analyzed as glass disks, these challenges can be overcome, thus enhancing the precision and accuracy of results. PANalytical and Claisse have now developed an application that can be used for the analysis of ferroalloys (in particular for FeSi) glass disks by XRF.
This information has been sourced, reviewed and adapted from materials provided by Malvern Panalytical.
For more information on this source, please visit Malvern Panalytical.