The high speed and versatile C-Swift+ is a CMOS detector series designed for routine materials analysis as well as high-throughput sample characterization.
The Oxford Instruments C-Swift+ benefits from many of the features that made the Symmetry such a revolutionary EBSD detector including a customized CMOS sensor designed for EBSD.
- Extreme sensitivity for low-energy and low-current analyses
- Guaranteed indexing speeds of > 2000 pps
- Distortion free images
- 622 x 512 pixel EBSPs at 250 pps
- Innovative fibre optic lens system providing unprecedented detector sensitivity
Overview
C-Swift+ is an excellent, high-throughput EBSD detector. Quite similar to the Symmetry detector, C-Swift+ employs a customized CMOS sensor to offer speed as well as sensitivity, thus assuring high-quality results on even the most difficult materials.
The maximum speed in excess of 2000 pps offered by C-Swift+ is accomplished with pattern resolution of 156 x 128 pixels. This represents four times the number of pixels when compared to the number used by a comparable CCD-based detector operating at analogous speeds, and thus guarantees reliable indexing and high hit rates on samples of all types.
When combined with the robust indexing algorithms in the AZtec software, the distortion-free optics allow C-Swift+ to offer exceptional angular precision below 0.05°. For applications that require higher-quality patterns, C-Swift+ can collect 622 x 512 pixel patterns at speeds of up to 250 pps, so it's excellently suited to complex multi-phase samples and detailed phase analysis.
This detector has been developed for effective and fast sample characterization. From the specialized proximity sensor to the optional integrated forescatter detectors, each component of the system has been developed to enhance the performance and ease of use and to render EBSD a standard tool in every laboratory.
Features
The C-Swif+t detector sets a new standard when speed is key:
- Assured indexing speeds of > 2000 pps with only 8 nA beam current
- Low distortion optics, guaranteeing an angular precision that is better than 0.05°
- 156 x 128 pixel pattern resolution at maximum speed — four times more pixels compared to a fast CCD detector at comparable speeds
- Seamless EDS integration even at the greatest speeds
- Full resolution (622 x 512) patterns — perfect for detailed phase and deformation analyses
- Specialized proximity sensor to detect potential collisions before they occur, and automatically move the detector to a safe position
- High sensitivity with an optimized phosphor screen, thus guaranteeing high-quality patterns at low beam energies and low doses — giving maximum spatial resolution
- Bellows SEM interface, maintaining the microscope’s vacuum integrity
- Five optional integrated forescatter detectors offering full color complementary channeling contrast and atomic number contrast images
- Simple and intuitive detector settings, guaranteeing best results every time