An atom probe is a type of microscope that uses an electric field to pull ions from a sample's exterior, then image and identify those ions. After ions are identified, a computer is used to create a three-dimensional model of the sample at the atomic scale.
Recently, atom probe technology has improved dramatically with new hardware components that simplify the process and enhance the rate of data acquisition. Additionally, new procedures have been created to extract testable samples from new kinds of materials.
All this adds up to an even wider range of applications, including the examination of thin multilayer films, dielectric films, and semiconductors. The knowledge gained from atom probes allows for the design and development of advanced materials capable of groundbreaking solutions.